Load Dependent Bending Motion Driven by LaNi5 Hydrogen Storage Alloy Film Deposited on Copper Thin Sheet
نویسندگان
چکیده
منابع مشابه
CO adsorption on a LaNi5 hydrogen storage alloy surface: a theoretical investigation.
Density functional theory calculations are carried out to study CO adsorption on the (001) surface of a LaNi(5) hydrogen storage alloy. At low coverages, CO favors adsorption on Ni-Ni bridge sites. With an increase in CO coverage, the decrease in the adsorption energy is much larger for Ni-Ni-CO bridge adsorption than that for Ni-CO on-top adsorption. Thus, the latter sites in the relatively st...
متن کاملAcoustic emission monitoring of activation behavior of LaNi5 hydrogen storage alloy.
The acoustic emission technique is proposed for assessing the irreversible phenomena occurring during hydrogen absorption/desorption cycling in LaNi5. In particular, we have studied, through a parametric analysis of in situ detected signals, the correlation between acoustic emission (AE) parameters and the processes occurring during the activation of an intermetallic compound. Decreases in the ...
متن کاملMore affordable electrolytic LaNi5-type hydrogen storage powders.
Compounding between NiO and La(2)O(3) protects the latter from water and molten salt attack, and ensures successful direct electrolytic conversion of the oxide precursors, in the solid state, to more affordable LaNi(5)-type hydrogen storage materials.
متن کاملThickness Dependence of Sensitivity in Thin Film Tin Oxide Gas Sensors Deposited by Vapor Pyrolysis
Transparent SnO2 thin films were deposited on porcelain substrates using a chemical vapor deposition technique based on the hydrolysis of SnCl4 at elevated temperatures. A reduced pressure self-contained evaporation chamber was designed for the process where the pyrolysis of SnCl4 at the presence of water vapor was carried out. Resistive gas sensors were fabricated by providing ohmic contacts o...
متن کاملCopper–titanium thin film interaction
Interaction between 5 lm thick copper and 50 nm thin titanium films was investigated as a function of annealing temperature and time using MeV He Rutherford backscattering, X-ray diffraction and dynamic Secondary Ion Mass Spectrometry. Samples were made by depositing 10 nm of titanium on a PECVD silicon oxynitride, followed by 50 nm of titanium nitride and 50 nm of titanium in the said order. I...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Japan Institute of Metals
سال: 2006
ISSN: 0021-4876,1880-6880
DOI: 10.2320/jinstmet.70.835